High quality, peer reviewed papers will be presented during the Tuesday/Wednesday/Thursday Technical Sessions. Papers will be presented in either oral 30 minute presentations or as Poster Papers (allowing the author and attendee time to discuss the paper in more detail).
The Technical Paper Sessions are aligned according to technical topic areas associated with the IEEE EMC Society Technical Committees.
EMC Management (TC1)
This committee is concerned with the development and dissemination of Best Practices and Methodologies for the successful leadership, supervision and guidance of EMC related activities. These Best Practices and Methodologies shall be structured so as to provide assistance to all managers, and engineers. Appropriate and convenient tools shall serve as a foundation to these Best Practices and Methodologies.
EMC Measurements (TC2)
This committee is concerned with the measurement and instrumentation requirements in EMC standards and procedures and how they are interpreted. Also concerned with the adequacy of measurement procedures and measurement instrumentation specifications for radiated and conducted emission and susceptibility tests and the rationale for performance limits for these tests.
Electromagnetic Environment (TC3)
This Technical Committee is to encourage research in the following areas:
• electromagnetic environment (EME)
• development of standards for EME measurement and characterization
• natural and man-made sources of electromagnetic environment that comprise this environment
• effects of noise (unwanted portions of EME) on systems performance
• effects of international civil and military standards intended to control man-made intentional and unintentional emissions of electromagnetic energy
EMI Control (TC4)
This committee is concerned with design, analysis, and modeling techniques useful in suppressing interference or eliminating it at its source. Bonding, grounding, shielding, and filtering are within the jurisdiction of this committee. These activities span efforts at the system, subsystem, and unit levels.
High Power Electromagnetics (TC5)
This committee is concerned with the effects and protection methods for electronic equipment and systems for all types of high power electromagnetic environments. These environments include electromagnetic pulse (EMP), intentional EMI environments (e.g. high power microwaves and ultrawideband), lightning electromagnetic currents and fields, and electrostatic discharge. Interactions with aircraft and other mobile systems are included.
Spectrum Management (TC6)
This committee is concerned with frequency coordination, management procedures for efficient spectrum use, band occupancy and congestion, federal regulations and their adequacy.
Low Frequency EMC (TC 7)
This committee is concerned with low-frequency EMC including Power Quality in electric power systems. The committee is focusing on application of fundamental EMC concepts also to low frequency conducted disturbances. EMC in power systems is expected to be increasingly important. This is due to increased use of electronics in renewables, electric vehicles, energy efficient technologies and Smart Grid applications.
Computational Electromagnetics (TC9)
This committee is concerned with broad aspects of Applied Computational Electromagnetic techniques which can be used to model electromagnetic interaction phenomena in circuits, devices, and systems. The primary focus is with the identification of the modeling methods that can be applied to interference (EMC) phenomena, their validation and delineating the practical limits of their applicability. Included are low and high frequency spectral-domain techniques and time-domain methods.
Signal Integrity (TC10)
This committee is concerned with the design, analysis, simulation, modeling and measurement techniques useful in maintaining the quality of electrical signals. These activities encompass all aspects of signal integrity from the integrated circuit level to the system level.
The newest technical topic area for the EMC Society, the topics include carbon nanotubes, composite materials, and other measurements, design, and analysis applications.